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International Society for Industrial Process Tomography

8th World Congress on Industrial Process Tomography

X-ray backscatter scanning of a macroscopically thick layered media for non-destructive characterization

Andrii Sofiienko 1*, Geir Anton Johansen 2, David M. Ponce 3, Marie Holstad 4 1 University of Bergen, Allegaten 55, PO Box 7803, 5020 Bergen, Norway

2 Bergen University College, Inndalsveien 28, PO Box 7030, 5020 Bergen, Norway

3 Visuray AS, Strandbakken 10, 4070 Randaberg, Norway

4 Christian Michelsen Research AS, Fantoftvegen 38, NO-5892 Bergen, Norway



This work presents an investigation of the backscatter response of a thick layered media composed of poly-methyl-methacrylate (8 mm), steel (8 mm), light cement (25 mm) and granite (66 mm) layers to X- rays in the energy range of 20 keV to 450 keV. We measured the backscattered X-ray spectra from different sample depths and for several X-ray incident beam angles using a single voxel scanning technique. We demonstrate that it is possible to characterise the internal structure of the studied sample at depths of up to 62 mm and at an accelerating potential of the X-ray tube of 450 kVp.

Keywords X-ray, backscattering, scanning, characterization

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