Register or Log In

International Society for Industrial Process Tomography

7th World Congress on Industrial Process Tomography

Study on a simulation-based scatter correction for high-resolution gamma-ray tomography

M. Wagnera,b , A. Bieberlea, U. Hampela,b

a Institute of Fluid Dynamics, Helmholtz-Zentrum Dresden - Rossendorf, Bautzner Landstr. 400, 01328 Dresden, Germany

b AREVA Endowed Chair of Imaging Techniques in Energy and Process Engineering, Technische Universit├Ąt Dresden, 01062 Dresden, Germany


Abstract


A simulation-based scatter correction algorithm is applied on CT data sets of mockup measurements acquired from the high- resolution gamma-ray tomography system of the Institute of Fluid Dynamics at Helmholtz-Zentrum Dresden-Rossendorf (HZDR). Based on the initially reconstructed image and on previous knowledge about the material distributions of the scanned object, a first-order scatter sinogram is simulated which allows a correction of the original data set. For two different mockups, the amount of the scatter and the shape of the imaging artifacts are analyzed.


Keywords: gamma-ray; computed tomography; scatter correction

Sign-in to access the full text