Register or Log In

International Society for Industrial Process Tomography

4th World Congress on Industrial Process Tomography

A Limited-Angle CT Approach for a Fast Scanned Electron-Beam X-Ray Tomography with Application to Multi-Phase Flow Measurements

M Speck, U Hampel, D Koch, H-G Mayer, H-J Menz, H-M Prasser, E Schleicher

Sign-in to access the full text